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SBS-150 少子寿命
 
   
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SBS-150 少子寿命

SBS-150 少子寿命 测量生长块的是获得最终晶圆少子寿命的最好办法.SBS-150体硅少子寿命分析仪对硅锭生长方向上的少子寿命变化特别敏感,能否准确预测切割出的硅片的质量和缺陷状态。

  • 商品编号:SBS-150
  • 商品重量:1000.000 克(g)
  • 货  号:SBS-150
  • 品  牌:Sinton Instrument
购买数量:
  (库存100)


Simple, flexible scanning tool offers a 2D profile of silicon growth quality. Built for simplicity and safety in production environments, with a sophisticated data analysis package enabling research and development.

Product Overview


Measuring as-grown blocks provides the best indication of final wafer lifetime.The SBS-150 bulk-silicon lifetime analyzer is especially sensitive to lifetime variations in the growth direction of silicon ingots, giving an accurate preview of wafer quality and propagation defects.

It addition, the SBS-150 offers the only lifetime scan with a lifetime measurement range of several orders of magnitude – a feature that is typical of Sinton Instruments true bulk lifetime characterization.
 
 
 
 
System Capabilities


Primary applications:

  
Example of lifetime map, taken at a medium resolution. Similar maps of resistivity and trap density are also standard.

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• Qualifying high-purity silicon with lifetimes in the 1–5 millisecond range
 
• Qualifying B-Cz silicon as-grown, without special surface preparation
 
• Characterizing lifetime, trap density and defect zones in multicrystalline blocks
 

Product features:


• Proximity sensor scan in the X-Y plane
 
• True bulk lifetime characterization using broadband IR excitation
 
• Ergonomic loading and unloading tray
 
• Easy-to-yse, intuitive operator controls
 
• Industry-compliant interlocks and enclosure ensure operator safety
 
• Configurable for top-loading

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