FMT_CCT

Advanced analysis of solar cells including light I-V and Suns-Voc data. Capability to accurately measure high-efficiency conventional or backside-contact solar cells. One-sun or concentrator instruments available. Product Overview The cell test family of instruments has been designed to have the highest possible accuracy for measuring high-efficiency silicon solar cells. This is accomplished using a patented multiflash technology. The standard analysis includes the commonly reported parameters for cell testers, but is supplemented with the Suns-Voc analysis that precisely indicates the source of power loss due to shunt and series resistance effects. The CCT family of concentrator testers allows the user to view the efficiency versus intensity curves and light I-V curves at multiple intensities based on a short automated series of measurements.
System Capabilities Available instruments:     The instrument interface displays both I-V and Suns-Voc data. This permits quick identification of shunt and series resistance effects. larger view The uniformity of the FCT-350 is Class A (±2%) over 156 mm x 156 mm. larger view • One-sun cell flash testing (FCT) • 30-sun medium concentration cell testing (CCT) • 1000-sun high concentration cell testing (HCCT) Analysis techniques: • Suns-Voc curve • 3-point production testing utilizing Suns-Voc, Jsc, Vload • Family of I-V curves versus intensity • Efficiency versus intensity characteristic